Olympus Introduces the BTX Profiler, a Combined XRD-XRF Analyzer for Comprehensive Materials Analysis

Olympus is pleased to announce the release of a new benchtop analyzer that combines X-ray Diffraction (XRD) and X-ray Fluorescence (XRF) in one unit. The BTX Profiler carries on the revolutionary XRD technology employed in NASA’s “Curiosity” Rover, part of the successful NASA Mars Science Laboratory program, and the highly acclaimed, award winning earthbound technology employed in Olympus Analytical X-ray Instruments. The BTX Profiler combines these to provide compositional materials analysis at the structural and elemental level affording economy of operational costs, space, and time with a seamless integration of data and results.